NEWARK, N.J., Sept. 17, 2019 /PRNewswire-PRWeb/ — The 40th IEEE Sarnoff Symposium 2019 features distinguished speakers from a broad set of industry segments, world class researchers from top universities in the US and a highly competitive technical program covering topics such as 6G, 5G, IoT, Cloud, Analytics, Network Automation, Edge Computing, Artificial Intelligence, Machine Learning, Data Science, Orchestration, Open Source projects and others that are making a big impact in 2019 and beyond. Thus, the symposium will provide a unique forum for rich discussion between researchers, practitioners and user community to share findings on leading edge research, implementation experiences and challenges.

KEYNOTE SPEAKERS

Jeannette M. Wing, Columbia University: Data for Good: Data Science at Columbia
Kireeti Kompella, Juniper Networks: Practical Steps Towards Self-Driving Networks
Peter Vetter, Nokia Bell Labs: New value creation with the Future X Network    
Jennifer Yates, AT&T Labs: 5G and the Role of AI

In addition to keynote talks, the program is structured as a series of invited talks from service providers, system OEMs, semiconductor providers and academics; peer reviewed technical paper presentations; and panel sessions with Q&A allowing a unique opportunity for cross-discipline dialogue. View the complete schedule.

Despite a packed agenda, the symposium provides many opportunities for networking during coffee breaks and lunch.

Available to receive CEU/PDH for attending this conference (an extra charge $10 for the Certificate is requested).

Date and Time

Start time: 23 September 2019 07:30 AM
End time: 24 September 2019 06:30 PM
All times are US/Eastern

Location

150 Bleeker St
Newark, New Jersey
United States 07103
Building: NJIT Campus Center

Registration Rates

IEEE Member: $150
Non-Member: $250
IEEE Student: $100
IEEE Member Day Pass: $75
Non-Member Day Pass: $125
IEEE Student Day Pass: $50
Optional CEU/PDH Certificate for attending the 2-day conference: $10

Registration Link: https://events.vtools.ieee.org/m/203300

Contact

Deepak Kataria
IEEE Princeton Central Jersey Section

SOURCE IEEE Sarnoff Symposium