Nanotronics Debuts nSpec 3.0-300MM Inspection System

Press Releases

Jul 12, 2017

SAN FRANCISCO, July 12, 2017 /PRNewswire/ — Nanotronics is debuting a novel compact 300MM inspection system that has a footprint, price, scalability and automation to be used in both fab and lab environments. At a fraction of the price of other tools with broader defect detection and analysis capabilities, nSpec® 3.0 is a new class of equipment.

Nanotronics Logo designed by Chermayeff & Geismar & Haviv

Nanotronics has expanded the range of its capabilities to enhance metrology features, including critical dimensions in the same convergent system that optimizes defect inspection and process control. Nanotronics advanced computer vision, machine learning, and artificial intelligence software automates manual inspection that previously required human-level intelligence to accurately detect and classify defects.

Nanotronics will be exhibiting nSpec® 3.0 at SEMICON West in booth #6648

Nanotronics is an Inc 5000 company founded in 2010 by Matthew Putman, PhD and has offices in California, Ohio, and New York. The company is venture backed by Founders Fund, Morgan Stanley, and is a personal investment of Gordon Moore, Jaan Tallinn, and Howard Morgan. Nanotronics customers include Amazon, Apple, Western Digital, Broadcom, Avago, ST Micro, IQE, II-VI, Soraa, Applied Optoelectronics, CrystalIS, and others. All Nanotronics products are designed and manufactured in California.

Nanotronics
Contact:  Alexis Stoller
Phone: 202-997-9862
Email: alexis@nanotronics.co
Website: nanotronics.co 

Nanotronics' nSPEC® 3.0

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SOURCE Nanotronics

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